Smart Ausgabe

Autor:

ole8000

Datum:

16. August 2008 18:24

Code:

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~$ sudo smartctl -d ata -a /dev/sda -F samsung smartctl version 5.38 [i686-pc-linux-gnu] Copyright (C) 2002-8 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: SAMSUNG HM160HI Serial Number: S14QJF0PA28845 Firmware Version: HH100-10 User Capacity: 160.041.885.696 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0 Local Time is: Sat Aug 16 18:10:36 2008 CEST ==> WARNING: May need -F samsung or -F samsung2 enabled; see manual for details. SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 60) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 60) minutes. SCT capabilities: (0x003f) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 4 3 Spin_Up_Time 0x0007 252 252 025 Pre-fail Always - 2000 4 Start_Stop_Count 0x0032 084 084 000 Old_age Always - 167940 5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 1 9 Power_On_Hours 0x0032 095 095 000 Old_age Always - 3112 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 918 191 G-Sense_Error_Rate 0x0032 094 094 000 Old_age Always - 65698 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 94 194 Temperature_Celsius 0x0022 106 094 000 Old_age Always - 44 (Lifetime Min/Max 10/48) 196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 144182 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 3473 198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 7240 199 UDMA_CRC_Error_Count 0x0036 252 252 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x000a 252 252 000 Old_age Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1 SMART Selective self-test log data structure revision number 0 Warning: ATA Specification requires selective self-test log data structure revision number = 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Completed [00% left] (0-65535) 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.